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Mr. Jiaxing Dong 

This person worked in the group from 2017 till 2018.

Affiliation: Ghent University - IMEC
Information Technology
Research Area: Variability modeling and yield analysis
Promotor: Wim Bogaerts

Specific Research Topics

Publications (2)

    International Journals

  1. Y. Xing, J. Dong, S. Dwivedi, U. Khan, W. Bogaerts, Accurate Extraction of Fabricated Geometry Using Optical Measurement, Photonics Research, 6 (11), p.1008-1020 (2018)  Download this Publication (3.5MB).
      International Conferences

    1. Y. Xing, J. Dong, U. Khan, Y. Ye, D. Spina, T. Dhaene, W. Bogaerts, From Parameter Extraction, Variability Models to Yield_Prediction, Latin America Optics & Photonics Conference (invited), Peru, p.paper W3E.1 (3 pages) (2018)  Download this Publication (1.5MB).
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