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Mr. Tom Sistermans  (Doctoral Researcher)

This person is working in this group since 2022.
Affiliation: Ghent University-IMEC
Department of Information Technology
Address: Technologiepark-Zwijnaarde 126
9052 Gent
Belgie
Office: iGent, Office 130.008
E-mail: tom.sistermans@ugent.be
Research Area: Nanophotonic Sensing of Chiral Molecules
Promotor: Alberto Curto
TomSistermans

Specific Research Topics

Publications (7)

    International Journals

  1. S. Elrafey, T. Sistermans, A. Curto, Subnanometric control of coupling between WS2 monolayers with a molecular spacer, ACS Applied Materials and Interfaces, 17(38), p.53935-53941 doi:10.1021/acsami.5c12764 (2025)  Download this Publication (3.6MB).
      International Conferences

    1. T. Sistermans, A. Krimovs, R. Pal, A. Curto, Circularly polarized luminescence enhancement with silicon metasurfaces, 35th International Symposium on Chirality, United States, (2025).
    2. T. Sistermans, A. Krimovs, R. Pal, A. Curto, Fluorescence-based chiral sensing with silicon metasurfaces, 15th International Conference on Metamaterials, Photonic Crystals and Plasmonics (invited), Spain, (2025).
    3. T. Sistermans, E. Mohammadi, T. V. Raziman, A. Curto, Silicon metasurfaces for enhanced fluorescence-based chiral sensing, IEEE Photonics Benelux Annual Symposium 2024, Netherlands, (2024).
    4. Y. Guo, T. Reep, J. Van Kerrebrouck, N. Singh, D. Schaubroeck, T. Sistermans, X. Guo, J. Han, J. Van Campenhout, G. Roelkens, A. Curto, D. Van Thourhout, Metasurface-enhanced, Graphene Photodetector for Near-to-Mid Infrared Integrated Photonics, 2D-EPL:Pioneering 2D Materials for Semiconductor Industry (invited), Belgium, (2024)  Download this Publication (1.6MB).
    5. Y. Guo, T. Reep, J. Van Kerrebrouck, D. Schaubroeck, T. Sistermans, X. Guo, G. Roelkens, J. Van Campenhout, A. Curto, D. Van Thourhout, Waveguide-integrated, metasurface-enhanced Photodetectors: Graphene and beyond, Photonics in Flatland-Empowering Nanophotonics with 2D Semiconductors (invited), Netherlands, (2024)  Download this Publication (2.7MB).
    6. T. Sistermans, R. H. Godiksen, S. A. Elrafey, A. Curto, Fluctuation imaging of nanoscale disorder in monolayer semiconductors, Annual Symposium of the IEEE Photonics Society Benelux Chapter, Belgium, (2023).
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