| Authors: | T. Sistermans, R. H. Godiksen, S. A. Elrafey, A. Curto |
| Title: | Fluctuation imaging of nanoscale disorder in monolayer semiconductors |
| Format: | International Conference Proceedings |
| Publication date: | 11/2023 |
| Journal/Conference/Book: | Annual Symposium of the IEEE Photonics Society Benelux Chapter
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| Location: | Ghent, Belgium |
| Citations: | Look up on Google Scholar
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