Publication detail

Authors:	D. Néel, T. Benyattou, P. Sanchis, J. Martí, W. Bogaerts, P. Dumon, R. Baets
Title:	Optical near-field study of photonic crystal tapers
Format:	International Journal
Publication date:	10/2009
Journal/Conference/Book:	Applied Optics
Volume(Issue):	48(30) p.5718-5721
Internal Reference:	[N-941]
DOI:
Download:	(561KB)

Abstract

A scanning near-field optical microscopy study is undertaken on photonic crystal tapers. These tapers are used to couple a 3 ìm wide multimode dielectric waveguide to a single-line defect monomode photonic crystal waveguide. Two kinds of taper, with or without a localized defect, are compared. Higher transmission efficiency is obtained when a defect is utilized. The near-field study at 1550 nm shows experimentally that this defect prevents leaky resonant states to appear in the taper and thus permits a decrease in out-of plane losses. These observations are supported by band diagram calculations.

Related Research Topics

• Silicon (nano)photonic devices fabrication with 193nm and 248nm (DUV) Optical lithography (1999-2012)
• Low-loss Nanophotonic waveguides (1999-2010)
• ePIXfab: Silicon Photonics Platform

Related Projects

• IST: PICCO (Photonic Integrated Circuits using photonic Crystal Optics)
• IST: ePIXnet (European Network of Excellence on Photonic Integrated Components and Circuits)