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Authors: J. Brouckaert, S. Selvaraja, W. Bogaerts, G. Roelkens, M.Y. Ling, J. Allaert, P. Dumon, D. Van Thourhout, R. Baets
Title: Silicon-on-Insulator Microspectrometer
Format: International Conference Proceedings
Publication date: 11/2008
Journal/Conference/Book: 13th Annual Symposium of the IEEE/LEOS Benelux chapter
Volume(Issue): p.7-10
Location: Netherlands
Internal Reference: [N-798]
Download: Download this Publication (456KB) (456KB)

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