Authors:	J. Brouckaert, W. Bogaerts, S. Selvaraja, P. Dumon, R. Baets, D. Van Thourhout
Title:	Planar Concave Grating Demultiplexer with High Reflective Bragg Reflector Facets
Format:	International Journal
Publication date:	2/2008
Journal/Conference/Book:	Photonics Technology Letters
Editor/Publisher:	IEEE,
Volume(Issue):	20(4) p.309-311
DOI:	10.1109/lpt.2007.915585
Citations:	106 (Dimensions.ai - last update: 14/4/2024) 81 (OpenCitations - last update: 3/5/2024) Look up on Google Scholar
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Abstract

We present measurement results of an ultracompact 4-channel silicon-on-insulator planar concave grating (PCG) demultiplexer fabricated in a complimentary metal-oxide semiconductor (CMOS)-line using deep-ultraviolet lithography. The demultiplexer has 4 output channels separated by 20nm and a footprint of only 280ƒÊm ~ 150ƒÊm. The crosstalk is better than -25dB and the on-chip loss is drastically reduced down to 1.9dB by replacing each facet by a second order Bragg reflector.

Related Research Topics

• Silicon (nano)photonic devices fabrication with 193nm and 248nm (DUV) Optical lithography (1999-2012)
• Photo-spectrometer based on heterogeneous integration (2004-2009)

Related Projects

• IWT: epSOC (electro-photonic System-On-Chip)