| Authors: | M. Zenari, M. Buffolo, F. Perale, C. De Santi, J. Goyvaerts, A. Grabowski , J.S. Gustavsson , R. Baets, G. Roelkens, G. Meneghesso, E. Zanoni, M. Meneghini | | Title: | Optical Degradation of 845 nm VCSELs With Different Oxide Apertures for Silicon Photonics | | Format: | International Journal | | Publication date: | 6/2026 | | Journal/Conference/Book: | IEEE Journal on Selected Topics in Quantum Electronics
| | Editor/Publisher: | IEEE, | | Volume(Issue): | 32(6) | | DOI: | 10.1109/JSTQE.2026.3702031 | | Citations: | Look up on Google Scholar
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