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Authors: Y. Ye, M. Wang, D. Spina, W. Bogaerts, T. Dhaene
Title: Time-domain characterization of photonic integrated filters subject to fabrication variations
Format: International Journal
Publication date: 8/2019
Journal/Conference/Book: Journal of Lightwave Technologies
Volume(Issue): 37(21) p.5561-5570
DOI: 10.1109/JLT.2019.2933311
Citations: 3 (Dimensions.ai - last update: 23/6/2024)
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Abstract

Fabrication variations are a key factor to degrade the performance of photonic integrated circuits (PICs), and especially wavelength filters. We propose an efficient modeling approach to quantify the effects of fabrication variations on the time-domain performance of linear passive photonic integrated circuits (including the wavelength filters) in the design stage, before fabrication. In particular, this novel approach conjugates the accuracy of the Polynomial Chaos (PC) expansion in describing stochastic variations and the efficiency of a Vector Fitting (VF)-based baseband modeling technique in performing time-domain simulations. A suitable example validates the performance of the proposed method.

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