Photonics Research Group Home
Ghent University Journals/Proceedings
About People Research Publications Education
 IMEC
intern

 

Publication detail

Authors: M. Muneeb, X. Chen, P. Verheyen, G. Lepage, S. Pathak, E.M.P. Ryckeboer, A. Malik, B. Kuyken, M. Nedeljkovic, J. Van Campenhout, G. Mashanovich, G. Roelkens
Title: Demonstration of silicon on insulator mid-infrared spectrometers operating at 3.8um
Format: International Journal
Publication date: 5/2013
Journal/Conference/Book: Optics Express
Editor/Publisher: Optical Society of America, 
Volume(Issue): 21(10) p.11659-11669
Internal Reference: [N-1423]
DOI:
Download: Download this Publication (2.1MB) (2.1MB)

Abstract

The design and characterization of silicon-on-insulator midinfrared spectrometers operating at 3.8ìm is reported. The devices are fabricated on 200mm SOI wafers in a CMOS pilot line. Both arrayed waveguide grating structures and planar concave grating structures were designed and tested. Low insertion loss (1.5-2.5dB) and good crosstalk
characteristics (15-20dB) are demonstrated, together with waveguide propagation losses in the range of 3 to 6dB/cm.

Related Research Topics

Related Projects


Back to publication list