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Authors: D. NĂ©el, T. Benyattou, P. Sanchis, J. Marti, W. Bogaerts, P. Dumon, R. Baets
Title: Characterization of SOI photonic crystals tapers by Scanning Near-Field Optical Microscopy (SNOM)
Format: International Conference Proceedings
Publication date: 5/2006
Journal/Conference/Book: European Materials Research Society (E-MRS) Spring Meeting
Volume(Issue): p.D S4 04
Location: Nice, France
Internal Reference: [N-541]
Download: Download this Publication (428KB) (428KB)

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