| Authors: | V.S. Volkov, S.L. Bozhevolnyi, D. Taillaert | | Title: | Near-field imaging of light diffraction out of slab waveguides | | Format: | International Journal | | Publication date: | 6/2004 | | Journal/Conference/Book: | Laser Physics Letters
| | Volume(Issue): | 1(6) p.311-316 | | DOI: | 10.1002/lapl.200410072 | | Citations: | 7 (Dimensions.ai - last update: 21/4/2024)
6 (OpenCitations - last update: 3/5/2024)
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Abstract
A collection scanning near-field optical microscope (SNOM) is used to image the propagating of light at telecommunication wavelengths (1520-1570 nm) along photonic crystal (PhC) slabs, which combine slab waveguides with in-plane PhCs consisting of one- and two-dimensional gratings. The efficient out-of-plane light diffraction is directly observed for both 1D and 2D gratings (period 590 nm) fabricated on silicon-on-insulator wafers and the corresponding SNOM images are presented. Using the obtained SNOM images, we analyze light intensity distributions along diffraction gratings measured at different wavelengths and/or distances from the sample surface. Related Research Topics
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