| Authors: | Z. Liu, N. Le Thomas, R. Baets | | Title: | Broadband, High Resolution, Sensitive Spectrometer Using an Integrated Optical Phased Array in Silicon Nitride and Fourier Imaging | | Format: | International Journal | | Publication date: | 10/2024 | | Journal/Conference/Book: | Journal of Lightwave Technologies
| | Editor/Publisher: | Optica/IEEE, | | Volume(Issue): | 14(8) | | DOI: | 10.1109/JLT.2024.3483556 | | Citations: | 1 (Dimensions.ai - last update: 21/12/2025)
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Abstract
We present a novel hybrid configuration of a spec- trometer consisting of an integrated Si3N4 optical phased array and a free-space Fourier-space imaging system. It combines broadband and high resolution performance in a small on-chip footprint. We achieve 0.5 nm resolution in a spectral range from 750 nm to 850 nm using an on-chip footprint of 0.56×0.22 mm2. As a proof of concept, we retrieve the optical spectrum of a single frequency titanium sapphire laser. Using an image sensor cooled down to -20◦C, the low detection limit is validated by measuring the optical spectrum of the Raman background generated by a laser pump propagating in a Si3N4 waveguide. Related Research Topics
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