| Authors: | M. Zenaria, M. Buffolo, M. Fornasier, C. De Santi, J. Goyvaerts, A. Grabowsky, J. Gustavsson, S. Kumari, A. Stassren, R. Baets, A. Larsson, G. Roelkens, G. Meneghesso, E. Zanoni, M. Meneghini | | Title: | Analysis of defect-related optical degradation of VCSILs for photonic integrated circuits | | Format: | International Conference Proceedings | | Publication date: | 3/2023 | | Journal/Conference/Book: | Proc. SPIE 12439, Vertical-Cavity Surface-Emitting Lasers XXVII
| | Volume(Issue): | 12439 p.paper 24390E (9 pages) | | Location: | San Francisco, United States | | DOI: | 10.1117/12.2655696 | | Citations: | Look up on Google Scholar
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