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Authors: M. Hsu, C. Merckling, S. El Kazzi, M. Pantouvaki, O. Richard, H. Bender, J. Meersschaut, J. Van Campenhout, P. Absil, D. Van Thourhout
Title: Diffraction studies for stoichiometry effects in BaTiO3 grown by molecular beam epitaxy on Ge(001)
Format: International Journal
Publication date: 12/2016
Journal/Conference/Book: Journal of Applied Physics
Volume(Issue): 120 p.225114
DOI: 10.1063/1.4972101
Citations: 4 ( - last update: 14/7/2024)
4 (OpenCitations - last update: 27/6/2024)
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