| Authors: | A. Li, W. Bogaerts | | Title: | Engineered Reflections in Silicon Ring Resonator: A New Degree of Freedom for Design | | Format: | International Conference Presentation | | Publication date: | 11/2017 | | Journal/Conference/Book: | IEEE Photonics Society Benelux Annual Symposium 2017
| | Volume(Issue): | p.95-98 | | Location: | Delft, Netherlands | | Citations: | Look up on Google Scholar
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Abstract
Traditional ring resonators can be manipulated through two factors: the coupling coeffi-cients and the optical roundtrip length. These two factors determine the most importantperformance parameters of the ring resonator such as the Q factor, the free spectralrange (FSR) and extinction ratio (ER). But there is another important factor that plays animportant role: the internal reflection(s). In this paper, we systematically discuss and ex-perimentally demonstrate our manipulation of reflections in silicon ring resonators by in-troducing one or two integrated tunable reflectors. Various applications and phenomenoncan be generated by these structures, including backscattering compensation, ultra wideFSR, Fano resonance and Electromagnetically induced transparency (EIT). |
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