| Authors: | D. Néel, T. Benyattou, P. Sanchis, J. Marti, W. Bogaerts, P. Dumon, R. Baets |
| Title: | Characterization of SOI photonic crystals tapers by Scanning Near-Field Optical Microscopy (SNOM) |
| Format: | International Conference Proceedings |
| Publication date: | 5/2006 |
| Journal/Conference/Book: | European Materials Research Society (E-MRS) Spring Meeting
|
| Volume(Issue): | p.D S4 04 |
| Location: | Nice, France |
| Citations: | Look up on Google Scholar
|
| Download: |
 (428KB) |
