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Authors: F. Clauwaert, P. Van Daele, R. Baets, P. Lagasse
Title: Characterization of device isolation in GaAs MESFET-circuits by boron implantation
Format: International Journal
Publication date: 3/1986
Journal/Conference/Book: Journal of the Electrochemical Society
Volume(Issue): 134(3) p.711-714
Internal Reference: [O-277]

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