| Authors: | J. Van Campenhout, P. Rojo Romeo, D. Van Thourhout, C. Seassal, P. Regreny, L. Di Cioccio, J.-M. Fedeli, R. Baets | | Title: | Thermal Characterization of Electrically Injected Thin-Film InGaAsP Microdisk Lasers on Si | | Format: | International Journal | | Publication date: | 6/2007 | | Journal/Conference/Book: | Journal of Lightwave Technology
| | Volume(Issue): | 25(6) p.1543-1548 | | DOI: | 10.1109/jlt.2007.895552 | | Citations: | 35 (Dimensions.ai - last update: 14/4/2024)
23 (OpenCitations - last update: 3/5/2024)
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Abstract
We have performed a numerical and experimental analysis of the thermal behavior of electrically injected microdisk lasers that are defined in an InGaAsP-based thin film bonded on top of a silicon wafer. Both the turn-on as well as the pulsed-regime
temperature evolution in the lasing region was simulated using the finite-element method. The simulation results are in good agreement with experimental data, which was extracted from
the broadening of the time-averaged emission spectra. Lasing at room temperature was only possible in pulsed regime due to the high thermal resistance (10 K/mW). Some strategies to decrease the thermal resistance of the microdisk lasers are proposed and
discussed. Related Research Topics
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