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Authors: W. Bogaerts, P. Bienstman, R. Baets
Title: Sidewall Roughness in Photonic Crystal Slabs: A Comparison of High-Contrast Membranes and Low-Contrast III-V Epitaxial Structures
Format: International Conference Proceedings
Publication date: 4/2003
Journal/Conference/Book: European Conference on Integrated Optics (ECIO)
Volume(Issue): p.349-352
Location: Prague, Czech Republic
Internal Reference: [N-226]
Download: Download this Publication (143KB) (143KB)

Abstract

We have simulated sidewall roughness in photonic crystal slabs. Structures with a low vertical index contrast (like III-V waveguides) are shown to be more prone to scattering at sidewall roughness than membranes or SOI-like structures.

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